Recently, Texas Instruments (TI) launched a pair of 32-bit incremental cumulative analog-to-digital converters (ADCs). These two devices combine high resolution, low noise and integrated fault detection, which successfully solved the problem that the required performance and characteristics could not be obtained in the past when evaluating and selecting devices. In addition, ads1262 and ads1263 are highly integrated and sensors are immediately available, eliminating external components that will increase system cost and reduce noise and drift performance. For more information, please visit.

At present, if system designers need to use high-resolution ADC, they must make concessions in other required technical specifications, such as low noise or low drift, and several other integration features. Ads1262 and ads1263 finally solve these problems by providing 32-bit resolution, integration, fault detection characteristics, fast data rate and wide temperature range, so as to help designers maximize the performance of programmable logic controller (PLC), industrial automation equipment and sensor measurement applications.

Main features and advantages of ads1262 and ads1263

Accurate measurement of small signal: small signal can be measured by 7 nvrms at 32-bit high resolution and 2.5 SPS data rate, which is essential for bridge applications with typical full-scale signal of 10mV or less. The offset error drift is also 80% lower than that of similar solutions, so as to ensure the measurement stability over the whole temperature range.

Reduce the number of components to reduce system cost, circuit board area and design time: ads1262 integrates a programmable gain amplifier (PGA), 2.5V reference, oscillator, level shifter, temperature sensor, dual excitation current source (IDAC) and 8 general input / output (GPIO) pins. Ads1263 adds an auxiliary 24 bit incremental cumulative ADC in systems that require parallel main channel conversion, sensor temperature compensation or sensor diagnosis.

Integrated monitoring and diagnosis: the integrated features such as internal signal chain monitoring, data error detection, sensor overload detection and a test digital to analog converter (DAC) can provide necessary fault detection and diagnosis for high reliability systems. Read ti’s new white paper to learn how to use the integrated diagnostic function of ads1262 and ads1263 to help improve system reliability.

Fast data rate: the maximum output data rate of 38 ksps enables ADC to be used in high data throughput industrial applications.

It can be used in harsh industrial environment. The operating temperature range of: – 40 ° C to + 125 ° C is 20 ° C higher than that of competitive products.

Application characteristics and advantage analysis of Ti 32-bit incremental cumulative analog-to-digital converter

Tools and technical support to speed up the design process

In order to speed up the time to market, Ti provides a series of support tools for ads1262 and ads1263, including a Ti designs reference design for high-resolution, low drift and precision weighing balance excited by AC bridge.

Ads1262 and ads1263 provide system designers with a complete support suite, including sampling data, an input / output buffer information specification (IBIS) model, an excel calculator tool to assist in device configuration, and a performance development kit (PDK). Ads1262evm-pdk and ads1263evm-pdk are available at Ti stores and authorized distributors.

Join the Texas Instruments online support community, find solutions, get help, and share knowledge and solve problems with peer engineers and Ti experts.

Engineers working with data converters such as ads1262 and ads1263 can also visit ti’s new data converter learning center to find guiding design resources according to different topics, such as basic knowledge of incremental cumulative ADC, ADC noise analysis and filtering, and driving ADC.

Responsible editor: GT

Responsible editor: GT

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